Tarnick, Steffen: search on Z-Library

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1

[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Design of embedded constant weight code checkers based on averaging operations

Tarnick, Steffen

Year:

2010

Language:

english

File:

PDF, 185 KB

english, 2010

2

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - A Low-Cost Accumulator-Based Test Pattern Generation Architecture

Magos, Dimitrios, Voyiatzis, Ioannis, Tarnick, Steffen

Year:

2008

Language:

english

File:

PDF, 348 KB

english, 2008

3

An Accumulator—Based Test-Per-Clock Scheme

Magos, Dimitrios, Voyiatzis, Ioannis, Tarnick, Steffen

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2011

Language:

english

File:

PDF, 560 KB

english, 2011

4

Design of Embedded Self-Testing Checkers fort-UED and BUED Codes

Steffen Tarnick

Journal:

Journal of Electronic Testing

Year:

2004

Language:

english

File:

PDF, 190 KB

english, 2004

5

Self-Testing Embedded Bordent-UED Code Checkers fort = 2kq − 1 withq = 2m − 1

Steffen Tarnick

Journal:

Journal of Electronic Testing

Year:

2008

Language:

english

File:

PDF, 500 KB

english, 2008

6

[IEEE 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Crete, Greece (2007.07.8-2007.07.11)] 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Design of Embedded m-out-of-n Code Checkers Using Complete Parallel Counters

Tarnick, Steffen

Year:

2007

Language:

english

File:

PDF, 184 KB

english, 2007

7

Single- and Double-Output Embedded Checker Architectures for Systematic Unordered Codes∗

Steffen Tarnick

Journal:

Journal of Electronic Testing

Year:

2005

Language:

english

File:

PDF, 158 KB

english, 2005

8

Embedded Checker Architectures for Cyclic and Low-Cost Arithmetic Codes

Albrecht P. Stroele, Steffen Tarnick

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 107 KB

english, 2000

9

Embedded Parity and Two-Rail TSC Checkers with Error-Memorizing Capability

Tarnick, Steffen

Journal:

Year:

1998

Language:

english

File:

PDF, 2.52 MB

english, 1998

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